WEI Min, JIA Lijun, DENG Hong. Design of Dielectric Spectrum Measurement Experiment Based on Lumped Parameter Test Technology[J]. Experiment Science and Technology, 2020, 18(1): 69-72, 105. DOI: 10.12179/1672-4550.20180349
Citation: WEI Min, JIA Lijun, DENG Hong. Design of Dielectric Spectrum Measurement Experiment Based on Lumped Parameter Test Technology[J]. Experiment Science and Technology, 2020, 18(1): 69-72, 105. DOI: 10.12179/1672-4550.20180349

Design of Dielectric Spectrum Measurement Experiment Based on Lumped Parameter Test Technology

  • The experiment on measuring dielectric spectrum of solid dielectric based on lumped parameter testing technology was proposed, and the frequency characteristics and temperature characteristics are measured by two kinds of testing techniques: detuning method and automatic balance bridge method. The test objects cover several typical dielectric materials in solid electronics, such as Al2O3 composite ceramics, PCB substrates, ferroelectric ceramics, etc. Experimental teaching scheme was designed for undergraduate students of Electronic Science and Technology, in order to cultivate students’ scientific thinking and practical ability.
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