Design Experiment of the Integrated Circuit Testing System Based on Operational Amplifiers

The shortage of integrated circuit testing talents and insufficient analysis of operational amplifier parameters in undergraduate teaching practice are two issues in current China. The experiment is a student-oriented comprehensive design experiment, including two progressive courses, namely test adapter design and automatic testing software development. The testing circuits for three typical operational amplifier parameters are provided in this article. The impact of the interaction of various parameters on measurement accuracy are analyzed and the means to reduce the impact are proposed. The design method of remote multi-parameter and multi-range switching circuit is given, for meeting the requirement of automatic test. As verified, the experimental results produced by the test system are consistent with the specified parameter range by the datasheet of the operational amplifier. The experiment includes the complete design flow of integrated circuit automatic test system, which provides the students not only the design practice for hardware circuits, embedded software and upper computer software, but also improves their system level design capability.