Teaching Design of Fault Tolerance Experiment for DRAM Memory Based on FPGA

In security application scenarios, data integrity is a concern. As the core memory component of computer systems, DRAM storage devices’ fault tolerance capabilities play a critical role in data integrity. A new method for multi-bit data error tolerance is proposed, and students are guided in hardware implementation through basic experiments to promote their mastery of FPGA design techniques. In extended experiments, students are required to deploy the designed fault tolerance circuit in the controller circuit, and add a system bus interface module and a fault injection module to promote their mastery of system design and verification techniques. By innovating experimental teaching content and methods, students can better understand and grasp the fault tolerance design methods of airborne electronic systems, thereby improving their innovation ability and engineering practice ability.