LIU Xianghua, ZHANG Junxia, SUN Limin, LU Xiaokang, LI Ruiqin. Improvement of Semi-thin Slices of Electron Microscopy Methods[J]. Experiment Science and Technology, 2017, 15(6): 51-52. DOI: 10.3969/j.issn.1672-4550.2017.06.012
Citation: LIU Xianghua, ZHANG Junxia, SUN Limin, LU Xiaokang, LI Ruiqin. Improvement of Semi-thin Slices of Electron Microscopy Methods[J]. Experiment Science and Technology, 2017, 15(6): 51-52. DOI: 10.3969/j.issn.1672-4550.2017.06.012

Improvement of Semi-thin Slices of Electron Microscopy Methods

  • Compared with the conventional semi-thin slicing technique,the improved method of semi-thin slicing technology has been improved in dyeing,dyeing time,anti-disc and chip tools.Using the improved semi-thin slicing technique,the resulting tissue structure is complete,the staining is clear and the level is clear.Practice shows that the improved technology is more suitable for the accurate positioning of the semi-thin sections of the transmission electron microscope,which is a simple and effective method.
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