扫描电镜中扫描透射成像装置的研制及应用

Development and Application of Scanning Transmission Electron Microscopy Imaging Device

  • 摘要: 使用扫描电镜自带的背散射电子探头(BSED)作透射散射电子探测器,设计了一套适合FEI Quanta 650FEG扫描电镜使用的扫描透射(STEM)成像装置,并制定了该STEM成像装置的操作说明。以埃洛石复合ZrO2纳米颗粒为观察对象,对自制STEM成像装置的实用性进行了验证。结果表明:STEM像衬度与背散射电子探头到样品之间的距离相关,通过调整背散射电子探头与样品之间的距离,可以实现高角环形暗场像的采集,使ZrO2纳米颗粒的亮度明显高于埃洛石;STEM像衬度与透射电镜采集的HAADF-STEM像一致,元素分布状态也与埃洛石和ZrO2纳米颗粒对应,表明所研制的STEM成像装置具有较好的实用性。

     

    Abstract: A set of scanning transmission electron microscopy (STEM) imaging device suitable for FEI Quanta 650FEG scanning electron microscope (SEM) was designed by using the back-scattering electron detector (BSED) of the SEM as the transmission-scattering electron detector, and the operation instructions of the STEM imaging device were formulated. The practicability of self-made STEM imaging device was verified by using halloysite composite ZrO2 nanoparticles as the observation sample. The results show that the contrast of STEM image is related to the distance between the BSED and the sample. By adjusting the distance between the BSED and the sample, the high-angle annular dark field (HAADF) image can be collected, and the brightness of ZrO2 nanoparticles is significantly higher than that of halloysite. The contrast of STEM image is consistent with HAADF-STEM image acquired by transmission electron microscope (TEM), and the distribution state of elements is also corresponding to halloysite and ZrO2 nanoparticles, indicating that the STEM imaging device has good practicability.

     

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