基于FPGA的DRAM存储器容错实验教学设计

Teaching Design of Fault Tolerance Experiments for DRAM Memory Based on FPGA

  • 摘要: 在安全应用场景中,数据的完整性备受关注。作为计算机系统的核心记忆元部件,动态随机存取存储器(DRAM)的容错能力对数据完整性起着关键作用。该文提出了一种基于缩短RS纠错码并融合数据交织的存储器多位数据错误容错方法,并设计了教学实验。在基础实验中指导学生进行硬件实现,以促进学生掌握现场可编程逻辑门阵列(FPGA)设计技术;在拓展实验中,要求学生在控制器电路中部署设计实现的容错电路,并加入系统总线接口模块、故障注入模块和数据交织模块,促进学生掌握系统设计和验证技术。通过创新实验教学内容和方法,帮助学生更好地理解和掌握机载电子系统的容错设计方法,从而提高学生的创新能力和工程实践能力。

     

    Abstract: In security application scenarios, data integrity is of paramount concern. As the core memory component of computer systems, the fault tolerance capability of dynamic random access memory (DRAM) memory plays a critical role in data integrity. This paper proposes a fault-tolerant method for multi-bit data errors in memory, based on shortened RS error-correcting codes and integrated with data interleaving, and a corresponding teaching experiment is designed. In basic experiments, students are guided in hardware implementation to promote their mastery of field programmable gate array (FPGA) design techniques. In extended experiments, they are required to deploy the designed and implemented fault-tolerant circuit within the controller circuit, and add a system bus interface module, a fault injection module, and a data interleaving module to promote their mastery of system design and verification techniques. By innovating experimental teaching content and methods, students can better understand and grasp the fault-tolerant design methods of airborne electronic systems, thereby improving their innovative and practical engineering capabilities.

     

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