基于运算放大器的集成电路测试系统设计实验

Design Experiment of the Integrated Circuit Testing System Based on Operational Amplifiers

  • 摘要: 针对当前集成电路测试人才匮乏和本科教学中运算放大器参数讲解不充分的问题,提出了围绕运算放大器多种参数的测试系统设计实验。该实验是以学生为主导的综合设计型实验,包括测试适配器设计、自动测试软件开发两门递进式课程。给出3种典型运算放大器参数的测试电路,分析了这些参数相互作用时对测量准确度的影响,并提出降低影响的方法以及多种参数及多个量程程控切换电路的设计方法,以满足自动测试需求。经验证,测试系统产生的实验结果与运算放大器手册中声明的参数范围一致。该实验包含集成电路自动测试系统完整设计流程,不仅为学生提供了硬件电路、嵌入式软件、上位机软件等实践设计平台,还锻炼了其系统级设计思维。

     

    Abstract: The shortage of integrated circuit testing talents and insufficient analysis of operational amplifier parameters in undergraduate teaching practice are two issues in current China. The experiment is a student-oriented comprehensive design experiment, including two progressive courses, namely test adapter design and automatic testing software development. The testing circuits for three typical operational amplifier parameters are provided in this article. The impact of the interaction of various parameters on measurement accuracy are analyzed and the means to reduce the impact are proposed. The design method of remote multi-parameter and multi-range switching circuit is given, for meeting the requirement of automatic test. As verified, the experimental results produced by the test system are consistent with the specified parameter range by the datasheet of the operational amplifier. The experiment includes the complete design flow of integrated circuit automatic test system, which provides the students not only the design practice for hardware circuits, embedded software and upper computer software, but also improves their system level design capability.

     

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