基于FPGA的DRAM存储器容错实验教学设计

Teaching Design of Fault Tolerance Experiment for DRAM Memory Based on FPGA

  • 摘要: 在安全应用场景中,数据的完整性备受关注。作为计算机系统的核心记忆元部件,DRAM存储器容错能力对数据完整性起着关键作用。提出了一种基于缩短RS纠错码并融合数据交织的存储器多位数据错误容错方法,设计了教学实验。在基础实验中指导学生进行硬件实现,以促进学生掌握FPGA设计技术;在拓展实验中,要求学生在控制器电路中部署设计实现的容错电路,并加入系统总线接口模块、故障注入模块和数据交织模块,促进学生掌握系统设计和验证技术。通过创新实验教学内容和方法,帮助学生更好地理解和掌握机载电子系统的容错设计方法,从而提高学生的创新能力和工程实践能力。

     

    Abstract: In security application scenarios, data integrity is a concern. As the core memory component of computer systems, DRAM storage devices’ fault tolerance capabilities play a critical role in data integrity. A new method for multi-bit data error tolerance is proposed, and students are guided in hardware implementation through basic experiments to promote their mastery of FPGA design techniques. In extended experiments, students are required to deploy the designed fault tolerance circuit in the controller circuit, and add a system bus interface module and a fault injection module to promote their mastery of system design and verification techniques. By innovating experimental teaching content and methods, students can better understand and grasp the fault tolerance design methods of airborne electronic systems, thereby improving their innovation ability and engineering practice ability.

     

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